The XI XPS Data-Base is available a series of volumes containing fully processed high quality printed output (A4 landscape format) in hard cover loose leaf binders.
Volumes currently available are:-
- The Elements (Vol. 1)
- Native Oxides (Vol. 2)
- Polymers and Polymer Damage (Vol. 3)
- Commercially Pure Binary Oxides (Vol. 4)
- Semiconductors (Vol. 5)
Each handbook is complete and self contained and includes comprehensive notes on the instruments and instrumental conditions used in recording the spectra as well as details of experimental procedures. Transmission functions, resolution settings and characteristics, energy reference considerations, traceability and calibration details are all covered. The spectra contain many peak fits and fully annotated wide scans with tabulated numerical quantiative summaries.
Contents:
- Instrument Details
- Experimental Details:
- Data Processing Details:
- Sample Details:
- Energy Resolution Details:
- Energy Scale Reference Energies and Calibration Details
- Electron Counting and Instrument Response Function Details
- Effects of Poorly Focusing the Distance between the Sample and the Electron Lens
- Quantitation Details and Choice of "Sensitivity Exponents"
- Crude Tests of the Reliability of Relative Sensitivity Factors
- Traceability Details
- Reference Papers Describing Capabilities of X-Probe and M-Probe XPS systems:
- The Spectra
The spectrum format is similar to that shown in the examples elswhere in these pages.
Contact Acolyte today for further details and sample pages.
